Annealing effect on microstructure, hardness and electrochemical corrosion behavior of copper- manganese alloy
Keywords:
Corrosion Behavior, Vickers Hardness, Internal Friction, Elastic Moduli, Electrical Resistivity, Lead-Calcium AlloysAbstract
The Cu98Ge2 alloy was annealed at 500 °C, 600 °C and 700 °C for 2 hours and characterized by x-ray diffractmeter, scanning electron microscope, digital Vickers micro-hardness tester and Gamry Potentiostat/Galvanostat with a Gamry framework system based on ESA 300. X-ray and scanning electron microscope analysis show a significant change on microstructural of Cu98Mn2 alloy after annealing at different temperature for 2 hours. Lattice microstrain of Cu98Mn2 alloy varied after annealed at different temperature for two hours. Vickers hardness and corrosion rate values of Cu98Mn2 alloy increased after annealing at different temperature for 2 hours. Corrosion current of Cu98Mn2 alloy decreased after annealing at 500 °C and 600 °C but it increased at 700 °C for 2 hours. The best annealing temperature for Cu98Mn2 alloy is 500 °C for 2 hours.
References
- Lai M.O, Lu L, Lee W.L, J. Mater. Sci., 31:6 (1996) 1537-1543
- A. B. El-Bediwi, Radia. Eff. Def. Sol. 159 (2004) 539–542.
- M.J. Esfandyarpour, R. Mahmudi, Mater. Sci. Eng. A 530 (2011) 402–410
- A Chrysanthou, G Erbaccio, J. Mat. Sci., 30 (1995) 6339–6344
- Y. Z Zhan, G. D Zhang, Key Eng. Mat., 249 (2003) 227–232
- K. Ichikawa, M Achikita, Mat. Trans. JIM, 34 (1993) 718–724
- R. H Palma, A. O Sepulveda, Mat. Sci. Forum, 416-418 (2003) 162
- B Tiang, P Liu, K Song, Y Li, Ren F, Mat. Sci. Eng., A 435-436 (2006) 705
- D. B Rajković, A. Devečerski, J. Serb. Chem. Soc., 72 (2007) 45–53
- P. KJena, E.A.I GBrocchi, I.G. Solorzano, Motta M.S, Mat. Sci. Eng., A 371 (2004) 72–78
- J.H Ahn, I.H Song, Y.D Hahn, Mat. Trans. JIM, 37 (1996) 733–737
- A Mukhtar, D.L Zhang, C Kong, P Munroe, IOP Conference Series, Mat. Sci. Eng., 4 (2009) 012005
- B. D. Cullity and S. R. Stock, Elements and x-ray diffraction, 3rd edn, (Prentice Hall). 2001
- C. Suryanarayana, Prog. Mater. Sci. 46: 1 (2001)
Downloads
Published
Issue
Section
License
Copyright (c) IJSRSET
This work is licensed under a Creative Commons Attribution 4.0 International License.