Survey Paper on Manufacturing Defect Analysis and Prediction for Inspecting a Product

Authors

  • Amit Hombal  School of Computing Science and Engineering, Vellore Institute of Technology, VIT University Chennai Campus, Chennai, Tamil Nadu, India
  • Pattabiraman V  School of Computing Science and Engineering, Vellore Institute of Technology, VIT University Chennai Campus, Chennai, Tamil Nadu, India

Keywords:

Defect prediction, Risk analysis, JSON schema

Abstract

Finding defects in the manufactured product before shipment by comparing client defined specification and on the basis of past history report in which defect were found by inspectors. Through this, a new guide line is to be produced for inspectors that where they have to stress while inspecting a products. And to predict the possible future defects in the product which is produced by a particular company. Based on the number of defects client has to decide whether to give future orders or next orders to the manufacturing company.

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International Journal of Scientific Research in Science, Engineering and Technology

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Published

2017-04-30

Issue

Volume 3, Issue 2, March-April-2017

Section

Research Articles

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This work is licensed under a Creative Commons Attribution 4.0 International License.

How to Cite

[1]
Amit Hombal, Pattabiraman V, " Survey Paper on Manufacturing Defect Analysis and Prediction for Inspecting a Product, International Journal of Scientific Research in Science, Engineering and Technology(IJSRSET), Print ISSN : 2395-1990, Online ISSN : 2394-4099, Volume 3, Issue 2, pp.850-856 , March-April-2017.