Triboelectrification of a Metal by Repeated Impacts on A Dielectric Film : Analytical and Numerical Study

Authors(1) :-SeongMin Kim

Theoretically, the impact triboelectrification between metal and dielectric films has been studied. We analyze the  relationship for the contact mode TENG at the impacts to investigate how the charge moves in the short-circuit state. The total charge of triboelectricity due to a number of impacts is analytically derived under short circuit conditions, taking into account the initial charge and the time-dependent charge relaxation.

Authors and Affiliations

SeongMin Kim
School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon, Korea

Repeated impacts, dielectric constant, triboelectrification

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Publication Details

Published in : Volume 3 | Issue 6 | September-October 2017
Date of Publication : 2017-10-31
License:  This work is licensed under a Creative Commons Attribution 4.0 International License.
Page(s) : 722-724
Manuscript Number : IJSRSET1736176
Publisher : Technoscience Academy

Print ISSN : 2395-1990, Online ISSN : 2394-4099

Cite This Article :

SeongMin Kim, " Triboelectrification of a Metal by Repeated Impacts on A Dielectric Film : Analytical and Numerical Study, International Journal of Scientific Research in Science, Engineering and Technology(IJSRSET), Print ISSN : 2395-1990, Online ISSN : 2394-4099, Volume 3, Issue 6, pp.722-724, September-October-2017.
Journal URL : http://ijsrset.com/IJSRSET1736176

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