Arima Analysis for Detecting FTIR and XRD Spectral Pattern on Barium Strosium Titanat (BST) Thin Film

Authors(2) :-Muhammad Nur Aidi, Irzaman

Knowledge about atomic and molecular structure of Barium Stronsium Titanat (BST) is very important for exploring the material characteristic of BST. Analyzing X-ray Diffraction and Fourier-transform Infrared (FTIR) Spectroscopy spectral pattern usually done by Rietvel model or General Structure Analysis System (GSAS). Both of these methods rely on reference pattern as guidance. XRD or FTIR data were first compared with reference data which then its charateristic indentified based on the reference data. ARIMA model could be used as alternative. ARIMA model does not need reference pattern as guidance. Research shows those FTIR and XRD values at heated BST powder could be modeled well by ARIMA. Therefore, studying atomic and molecular structure of BST could be done via reflectant function which derived from XRD and FTIR values with ARIMA approach. Result showed that first differencing model in ARIMA with order AR (2) and order MA (2) or less were very good for explaining Lanthanum Oxide (0%, 5%, and 10%) doped BST FTIR data. First differencing model in ARIMA with order AR (3), and order MA (3) or less were very good for explaining Lanthanum Oxide (0%, 5%, and 10%) doped BST XRD data. Accuracy of ARIMA model for explaining Lanthanum Oxide (0%, 5%, and 10%) doped BST FTIR data is more accurate than Lanthanum Oxide (0%, 5%, and 10%) doped BST XRD data. This is due to model ARIMA for Lanthanum Oxide (0%, 5%, and 10%) doped BST FTIR data is more simple (more parsimony) and its Determinant coefficient is higher.

Authors and Affiliations

Muhammad Nur Aidi
Statistics Department, Bogor Agricultural University, Dramaga Bogor Indonesia
Physics Department, Bogor Agricultural University, Kampus IPB Dramaga Bogor Indonesia

ARIMA, FTIR, XRD, BST, Lanthanum oxide

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Publication Details

Published in : Volume 4 | Issue 1 | January-February 2018
Date of Publication : 2018-02-28
License:  This work is licensed under a Creative Commons Attribution 4.0 International License.
Page(s) : 870-883
Manuscript Number : IJSRSET1841227
Publisher : Technoscience Academy

Print ISSN : 2395-1990, Online ISSN : 2394-4099

Cite This Article :

Muhammad Nur Aidi, Irzaman, " Arima Analysis for Detecting FTIR and XRD Spectral Pattern on Barium Strosium Titanat (BST) Thin Film , International Journal of Scientific Research in Science, Engineering and Technology(IJSRSET), Print ISSN : 2395-1990, Online ISSN : 2394-4099, Volume 4, Issue 1, pp.870-883, January-February-2018.
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