Classification Detection of Ftir And Xrd Spectrum on Thin Film of Lithium Tantalate With Arima Model On High Level Accuracy

Authors

  • Muhammad Nur Aidi  Department of Statistics, Faculty of Mathematics and Sciences Natural (FMIPA), Bogor Agricultural University (IPB), Kampus IPB Dramaga Bogor Indonesia
  • Irzaman  Department of Physics, Faculty of Mathematics and Sciences Natural (FMIPA), Bogor Agricultural University (IPB), Kampus IPB Dramaga Bogor Indonesia

Keywords:

Lithium Tantalate, Lanthanum Oxide, XRD, FTIR, ARIMA, Determinancy coeficiency (R2), MAPE

Abstract

Lithium tantalate (LiTaO3) is very good for electrooptical modulator and pyroelectric detector. Therefore, LiTaO3 detection was very important to get the deeper image of its material characteristics. LiTaO3 detection methods were such as X-ray powder diffraction (XRD), and Fourier-transform infrared spectroscopy (FTIR and were then modelled by Reietveld model or General Structure Analysis System (GSAS) which were based on reference pattern as comparison. ARIMA model could also be used as alternative. ARIMA model did not need reference pattern as comparison. ARIMA models classify XRD and FTIR data to autoregression non differencing models. ARIMA model for Lanthanum Oxide (0%, 5 %, 10 %) doped Lithium Tantalate FTIR were ARIMA (3,0,1), ARIMA (3,0,0), ARIMA (3,0,1) which are R2 value of ARIMA model which exceed 80% (94%, 94%, 97%). ARIMA model for Lanthanum Oxide (0%, 5 %, 10 %) doped Lithium Tantalate XRD were ARIMA (5,0,1), ARIMA (5,0,1), ARIMA (7,0,0) which are R2 value of 91%, 92%, 87%.ARIMA model for FTIR value was simpler and has lower MAPE than ARIMA model for XRD value. Lithium Tantalate doping with 5% and 10% Lanthanum Oxide could decrease the FTIR and XRD value control.

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International Journal of Scientific Research in Science, Engineering and Technology

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Published

2018-03-31

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Volume 4, Issue 4, March-April-2018

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Research Articles

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[1]
Muhammad Nur Aidi, Irzaman, " Classification Detection of Ftir And Xrd Spectrum on Thin Film of Lithium Tantalate With Arima Model On High Level Accuracy, International Journal of Scientific Research in Science, Engineering and Technology(IJSRSET), Print ISSN : 2395-1990, Online ISSN : 2394-4099, Volume 4, Issue 4, pp.18-50, March-April-2018.