Optical Charactterization and Fractal Dimensional Analysis of CdZnS Thin Films

Authors(3) :-Ritu Shrivastava, S. C. Shrivastava, Priyanka

Using chemical bath deposition technique, cdzns thin films has been prepared on glass substrates. Room temperature photoluminescence analysis in the 400-700 nm emission wavelength ranges for the excitation energy 365nm show the green emission band related to exciton-donorcomplexes formed in presence of S / excess Cd are observed in the PL emission spectra of different cdzns films. Some properties related to nanocrystalline effects are also found. The influence of variation of ratio of cadmium and sulphur was studied on the PL emission intensity of cdzns thin films. Fractal dimensional analysis is also very useful in the characterization of thin films. In this paper characterization of thin film has done by fractal dimensional analysis of Atomic Force Microscope image of cdzns thin film.

Authors and Affiliations

Ritu Shrivastava
Shri Shankaracharya Engineering College Junwani, Bhilai, Durg, Chhattisgarh, India
S. C. Shrivastava
Rungta College of Engineering & Technology, Bhilai, Durg, Chhattisgarh, India
Priyanka
Rungta College of Engineering & Technology, Bhilai, Durg, Chhattisgarh, India

Photoluminescence, Fractal Dimension, Chemical Bath Deposition, Thin Films, cdzns.

  1. J. Herrero, M. T. Gutierrez, C. Guillen, J. M. Dona, M. A. Martinez, A. M. Chaparro, R. Bayon, Thin Solid Films 361 28 (2000).
  2. M. E. Calixto, P. J. Sebastian, Solar Energy Materials and Solar Cells 59 65 (1999).
  3. U. Pal, R.Silva-Gonzalez, G. Martinez-Montes, M.Gracia-Jimenez, M.A.Vidal, Sh.Torres, Thin Solid Films 305 345 (1997).
  4. J. H. Schon, O. Schenker, B. Batlogg, Thin Solid Films 385 271 (2001).
  5. J. Levinson, F.R.Shepherd, P.J.Scanlon, W.D.Westwood, G.Este, M.Rider, Journal of Applied Physics 53 1193 (1982).
  6. Toshiya Hayashi, Takehiro Nishikura, Tatsuro Suzuki, Yoshinori Ema, Journal of Applied Physics, 64 3542 (1988).
  7. T. L. Chu, S. S. Chu, C.Ferekides, C. Q. Wu, J. Britt, C. Wang, Journal of Applied Physics 707608 (1991).
  8. R. E. Halsted, M. Aven, Phys. Rev. Lett. 14, Y533(2-1) (1965).
  9. S. Iida, M. Toyama, J. Phys. Soc. (Japan) 31, 190 (1971).
  10. Y. Kokubun, T. Kaeriyama, J. Appl. Phys. (Japan) 14, 1403 (1975).
  11. S. M. Thomsen, R. H. Bube, Rev. Sci. Instrum., 26, 664 (1955).
  12. R. H. Bube, Phys. Rev. 99, 1105 (1955).
  13. G. Wakefield, H.A. Keron, P.J. Dobson and J.L.Hutchinson, J. Phys. Chem. Solids, 60(1999)503.
  14. R. Reisfield, T.Saradairov, E.Ziganski, M.Gaft, S. Lis, M.Pietraszkiewiez, J. Lumin.102-103(2003) 243.
  15. J.D.G.Duran, M.C. Guindo, A.V. Delgado, J. Collide, Interface Sci. 193 (1997) 223.
  16. Marx E, Malik I J, Strausser Y E, Bristow T, Poduje N, Stover J C 2002 J. Vac. Sci. Technol.B 20 31
  17. Buijnsters J G, Camero M, Vázquez L 2006 Phys. Rev. B 74 1554175

Publication Details

Published in : Volume 4 | Issue 6 | January-February 2018
Date of Publication : 2018-02-28
License:  This work is licensed under a Creative Commons Attribution 4.0 International License.
Page(s) : 98-100
Manuscript Number : IJSRSET184447
Publisher : Technoscience Academy

Print ISSN : 2395-1990, Online ISSN : 2394-4099

Cite This Article :

Ritu Shrivastava, S. C. Shrivastava, Priyanka , " Optical Charactterization and Fractal Dimensional Analysis of CdZnS Thin Films, International Journal of Scientific Research in Science, Engineering and Technology(IJSRSET), Print ISSN : 2395-1990, Online ISSN : 2394-4099, Volume 4, Issue 6, pp.98-100, January-February.2018
URL : http://ijsrset.com/IJSRSET184447

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