Analysis of Testing Techniques for Low Power Applications

Authors

  • M. PavithraJyothi  Research Scholar ,SUNRISE University, Alwar, Rajasthan, India
  • Dr. C. Ramsingla  Professor, Department of ECE, SUNRISE University, Alwar, Rajasthan, India

Keywords:

Test Pattern, X-Filling, Arithmetic Coding, Genetic Algorithms, Built, Self-Test.

Abstract

Power consumption during test has become an important role in test manufacturing because it can lead to the destructive testing and some time the problem of wrong response due to overheating, so reducing power is a main objective during circuit design. This paper proposes comparison of results of the existing techniques. New techniques can be proposed in the future to reduce more power without any compromise.

References

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International Journal of Scientific Research in Science, Engineering and Technology

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Published

2016-12-30

Issue

Volume 2, Issue 6, November-December-2016

Section

Research Articles

License

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This work is licensed under a Creative Commons Attribution 4.0 International License.

How to Cite

[1]
M. PavithraJyothi, Dr. C. Ramsingla "Analysis of Testing Techniques for Low Power Applications" International Journal of Scientific Research in Science, Engineering and Technology (IJSRSET), Print ISSN : 2395-1990, Online ISSN : 2394-4099, Volume 2, Issue 6, pp.766-769, November-December-2016.