Synthesis and Characterization of LSM Thin Films as Cathode for SOFC
Keywords:
Spray Pyrolysis, Cath- D. Perednis, L.J. Gauckler, Solid State Ionics 166 (2004) 229-239.
- E.C.Thomson, G.W.Coffey, L.R.Pederson, O.A.Maria, Journal of power sources 191 (2009) 217-224.
- S.Calderon V, L.Escobar-Alarcon, Enrique Vamps, S.Muhl, M.Rivera, I. Bentacourt,
- Bhavana Godbole, Nitu Badera, S.B.Shrivastav and V.Ganesan. Jr.of Instrum. Soc. of India. Vol.39 No. 1, March 2009
- Agata Lisińska-Czekaj et.al. IOP Conf. Series: Materials Science and Engineering 18 (2011) 092.
- R. Mariappan, M. Ragavendar, G. Gowrisankar, Chalcogenide Letters, vol.7 No.3 March 2010, p.211-216.
- Bhavana Godbole, Nitu Badera, S.B.Shrivastav and V.Ganesan. Jr.of Instrum. Soc. of India. Vol.39 No. 1, March 2009
- Moises R. Cesario,Danial A.Macedo, Rosane M.P. B.Oliveria,Patricia M. Pimental, Roberto L.Moreira and Dulce M.A.Melo. Journal of Ceramic Processing Research Vol.12, No.1pp.102-105(2011)
- V.S.Reddy Channu, Rudolf Holze, Edwin H. Walkar. New Journal of Glass and Ceramics, 2013, 3, 29-33.
- Seo Miyamuru, E.S.Couto, A.A; Lima, N.B., Kolher A.C.; PreriaSoares E.
- D.Perednis, L.J.Gauckler. Solid State Ionics 166(2004) 229-239 2014
Abstract
Strontium-doped lanthanum manganite (La0.9Sr0.1MnO3-δ-LSM) have synthesized by using spray pyrolysis techniques. The deposition of thin films via spray pyrolysis involves spraying metallic salt solution on a heated substrate. The solution droplets reach the substrate surface, where solvent evaporation and the decomposition of the salt occurs, forming a film. The film morphology and thickness depends on the volume of solution sprayed and substrate temperature.
Strontium-doped lanthanum manganite ( La0.9Sr0.1MnO3-δ-LSM ) were synthesized by spray pyrolytic technique in thin film form on glass (quartz) substrate optimizing the spray parameters to obtain pin-hole free, crack free and porous thin film sintered at 650oC and thin films were characterized by thermo gravimetric analysis, X-ray diffractometry (XRD), Scanning electron microscopy. Film thickness measurement was carried out by using surface profilometer.
References
- D. Perednis, L.J. Gauckler, Solid State Ionics 166 (2004) 229-239.
- E.C.Thomson, G.W.Coffey, L.R.Pederson, O.A.Maria, Journal of power sources 191 (2009) 217-224.
- S.Calderon V, L.Escobar-Alarcon, Enrique Vamps, S.Muhl, M.Rivera, I. Bentacourt,
- Bhavana Godbole, Nitu Badera, S.B.Shrivastav and V.Ganesan. Jr.of Instrum. Soc. of India. Vol.39 No. 1, March 2009
- Agata Lisińska-Czekaj et.al. IOP Conf. Series: Materials Science and Engineering 18 (2011) 092.
- R. Mariappan, M. Ragavendar, G. Gowrisankar, Chalcogenide Letters, vol.7 No.3 March 2010, p.211-216.
- Bhavana Godbole, Nitu Badera, S.B.Shrivastav and V.Ganesan. Jr.of Instrum. Soc. of India. Vol.39 No. 1, March 2009
- Moises R. Cesario,Danial A.Macedo, Rosane M.P. B.Oliveria,Patricia M. Pimental, Roberto L.Moreira and Dulce M.A.Melo. Journal of Ceramic Processing Research Vol.12, No.1pp.102-105(2011)
- V.S.Reddy Channu, Rudolf Holze, Edwin H. Walkar. New Journal of Glass and Ceramics, 2013, 3, 29-33.
- Seo Miyamuru, E.S.Couto, A.A; Lima, N.B., Kolher A.C.; PreriaSoares E.
- D.Perednis, L.J.Gauckler. Solid State Ionics 166(2004) 229-239 2014
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