TAREQ HASHIM ABBOOD. The Behavior of High Scanning Electron Voltage in SEM Due to Mirror Effect. International Journal of Scientific Research in Science, Engineering and Technology, [S. l.], v. 11, n. 4, p. 189–195, 2024. DOI: 10.32628/IJSRSET24114117. Disponível em: https://ijsrset.com/index.php/home/article/view/IJSRSET24114117.. Acesso em: 21 nov. 2024.